The optical properties of planar waveguides were investigated with their core layers formed by a silicon nanocrystal superlattice. M-line measurements of the different waveguides were found to yield mode indices, which were then modeled by assuming anisotropic optical properties of the core layer. The refractive index values of the Si-nc-rich layer, were estimated using Bruggemann approximation method for isotropic media. The value of the form birefringence were determined using m-line measurements with the structural data obtained by transmission electron microscopy analysis. The results show a high value of 1% of the form birefringence.
|Titolo:||Birefringence in optical waveguides made by silicon nanocrystal superlattices|
|Data di pubblicazione:||2004|
|Appare nelle tipologie:||1.1 Articolo su Rivista/Article|