Measurement of angle-resolved light scattering in porous silicon films was discussed. The aperture of scattering rings was useful to measure optical birefringence. Birefringence changes were studied when pores were filled with liquids, and when the porous silicon layer was chemically etched in HF. Optical anisotropy was also measured.
Scattering rings as a tool for birefringence measurements in porous silicon
OTON NIETO, CLAUDIO JOSE;
2003-01-01
Abstract
Measurement of angle-resolved light scattering in porous silicon films was discussed. The aperture of scattering rings was useful to measure optical birefringence. Birefringence changes were studied when pores were filled with liquids, and when the porous silicon layer was chemically etched in HF. Optical anisotropy was also measured.File in questo prodotto:
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