A testing methodology for commercial automated test equipment (ATE) conventionally used for electrical integrated circuits is developed for photonic integrated circuits. The method is assessing by efficiently characterizing a packaged low-port optical switch matrix.

Automated characterization of SiP MZI-based switches

GAMBINI, Fabrizio;FARALLI, STEFANO;
2015-01-01

Abstract

A testing methodology for commercial automated test equipment (ATE) conventionally used for electrical integrated circuits is developed for photonic integrated circuits. The method is assessing by efficiently characterizing a packaged low-port optical switch matrix.
2015
9781479981793
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11382/516780
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